CIQTEK FESEM – SEM4000X
Stable, Versatile, Flexible, and Efficient
The CIQTEK FESEM – SEM4000X is a stable, versatile, flexible, and efficient field emission scanning electron microscope (FE-SEM). It achieves a resolution of [email protected], and easily tackles high-resolution imaging challenges for various types of samples. It can be upgraded with an ultra-beam deceleration mode to enhance low-voltage resolution even further.
The microscope utilizes multi-detector technology, with an in-column electron detector (UD) capable of detecting SE and BSE signals while providing high-resolution performance. The chamber-mounted electron detector (LD) incorporates crystal scintillator and photomultiplier tubes, offering higher sensitivity and efficiency, resulting in stereoscopic images with excellent quality. The graphic user interface is user-friendly, featuring automation functions such as automatic brightness & contrast, auto-focus, auto stigmator, and automatic alignment, allowing for rapid capture of ultra-high resolution images.
Key Features:
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CIQTEK FESEM – SEM4000X
Stable, Versatile, Flexible, and Efficient
The CIQTEK FESEM – SEM4000X is a stable, versatile, flexible, and efficient field emission scanning electron microscope (FE-SEM). It achieves a resolution of [email protected], and easily tackles high-resolution imaging challenges for various types of samples. It can be upgraded with an ultra-beam deceleration mode to enhance low-voltage resolution even further.
The microscope utilizes multi-detector technology, with an in-column electron detector (UD) capable of detecting SE and BSE signals while providing high-resolution performance. The chamber-mounted electron detector (LD) incorporates crystal scintillator and photomultiplier tubes, offering higher sensitivity and efficiency, resulting in stereoscopic images with excellent quality. The graphic user interface is user-friendly, featuring automation functions such as automatic brightness & contrast, auto-focus, auto stigmator, and automatic alignment, allowing for rapid capture of ultra-high resolution images.
Key Features:
| CIQTEK SEM4000X FESEM Microscope Specifications | ||
| Electron Optics | Resolution | 0.9 nm@ 30 kV, SE |
| 1.2 nm@15 kV, SE | ||
| 1.9 nm@1 kV, SE | ||
| 1.5 nm@1 kV (Ultra beam deceleration) | ||
| 1 nm@15 kV (Ultra beam deceleration) | ||
| Acceleration Voltage | 0.2 kV ~ 30 kV | |
| Magnification (Polaroid) | 1 ~ 1,000,000 x | |
| Electron Gun Type | Schottky Field Emission Electron Gun | |
| Specimen Chamber | Camera | Dual Cameras (Optical navigation + chamber monitoring) |
| Stage Range | X: 110 mm | |
| Y: 110 mm | ||
| Z: 50 mm | ||
| T: -10°~ +70° | ||
| R: 360° | ||
| SEM Detectors and Extensions | Standard | In-lens Electron Detector: UD-BSE/UD-SE |
| Everhart-Thornley Detector: LD | ||
| Optional | Backscattered Electron Detector (BSED) | |
| Retractable Scanning Transmission Electron Microscopy Detector (STEM) | ||
| Low Vacuum Detector (LVD) | ||
| Energy Dispersive Spectrometer (EDS / EDX) | ||
| Electron Backscatter Diffraction Pattern (EBSD) | ||
| Specimen Exchange Loadlock (4 inch /8 inch) | ||
| Trackball & Knob Control Panel | ||
| Ultra Beam Deceleration Mode Technology | ||
| User Interface | Language | English |
| OS | Windows | |
| Navigation | Optical Navigation, Gesture Quick Navigation, Trackball (optional) | |
| Automatic Functions | Auto Brightness & Contrast, Auto Focus, Auto Stigmator | |
