ZEM Ultra Field Emission Desktop-SEM uses a Schottky field emission electron source and a three-stage independent vacuum design. Its resolution is better than 2.5nm and meets the needs of characterisation of most samples’ micro and nano structures.
Standard configuration of large beam and large sample bin, support in-situ functional sample table and EDS/EBSD expansion.
Product Features:
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ZEM Ultra Field Emission Desktop-SEM uses a Schottky field emission electron source and a three-stage independent vacuum design. Its resolution is better than 2.5nm and meets the needs of characterisation of most samples’ micro and nano structures.
Standard configuration of large beam and large sample bin, support in-situ functional sample table and EDS/EBSD expansion.
Product Features:
