The ZEM Series Desktop SEM Tensile-Heating System features a self-developed tungsten filament electron gun. The system has an adjustable acceleration voltage ranging from 1-15kV, combined with a secondary electron detector, a backscattered electron detector, and a 1000N in-situ tensile sample stage.  This enables in-situ tensile, compression or bending experiments within the scanning electron microscope.

In-Situ Tensile Stage Parameters

• Load Range: 0-1000N
• Displacement Resolution: 20nm
• Heating Module: Optional
• Loading Functions: Tensile, Compression, Three-Point Bending

SEM Host Machine Features

• Vacuum Separation Technology: Utilises a unique vacuum design where the electron gun and sample chamber have separate vacuums, allowing for sample change in less than 1 minute.
• Extra-Large Sample Chamber: Provides a larger sample storage space for convenient user operation.
• Ultra-High Resolution: Achieves a maximum magnification of 360,000 times with a resolution of 5nm at 20kV.
• Standard Equipped Deceleration Mode: Allows for the observation of weakly conductive samples without gold sputtering.
• In-Chamber Camera: The sample chamber is equipped with a high-definition camera for real-time monitoring of sample changes during in-situ experiments.