PicoFemto in-situ TEM High-Temperature Mechanics Measurement system integrates both a mechanical measurement module and a MEMS chip module, allowing quantitative mechanical measurements to be performed while the sample is heated up to 1000 ℃. The MEMS chip module can be equipped with a choice of either a heating chip or an electrical measurement chip.

The mechanical measurement module can choose different load sensors to meet different experimental needs.

This product realises the real sense of high-resolution quantitative in-situ high-temperature mechanics research in transmission electron microscopy.

Transmission electron microscope index – Compatible with specified electron microscope models and pole shoes;

Some models of electron microscopes can be selected with a double-tilt version, double-tilt electrical measurement sample rod Y-axis inclination ± 25 °; (at the same time, limited by the pole shoe spacing);

Mechanical transducer indicators:

• Maximum load 100 mN (optional 0.1 mN, 1 mN, 10 mN, 100 mN);
• Force measurement noise is better than 5nN (0.1 mN maximum load);
• The measured resolution of force measurement is better than 5 nN (at 0.1 mN maximum load);
• Automatic force-distance curve measurement and automatic saving.

Heating index

Temperature control range: room temperature to 1000 ℃;

Temperature accuracy: better than 5%;

Temperature stability: better than ± 0.1 ℃.

Scanning probe manipulation index

Coarse adjustment range: X direction 1.5 mm, YZ direction 2 mm;

Fine adjustment range: XY direction 20 um, Z direction 10 um;

Fine adjustment resolution: XY direction 0.4 nm, Z direction 0.2 nm.

Features – Extremely large mechanical measurement and temperature control range. Mechanical research under multiple fields.

High stability: easily obtain high-resolution images in large-scale motion, suitable for a wider range of application scenarios and sample systems.

Ultra-long life: The patented technology (Patent Type: Utility Model (Electron Microscope In-situ Sample Rod with High Resolution Multi-dimensional Manipulation and Electrical Measurement) Patent No.: 202020944865.4) “claw-ball” structure of the probe rod is widely recognised as a robust and durable probe rod due to its unique structural design.

Ultra-low maintenance cost: the tip preparation system of the equipment can be used to prepare the tip consumables at low cost.” The “claw-ball” micromotion structure has been realised through modular mass production, with low maintenance costs.