PicoFemto in-situ TEM TEM-STM Photoelectric Integrated Measurement System is a standard shape transmission electron microscope sample rod.

Equipped with a scanning probe control unit, the probe can manipulate the individual nanostructures and perform electrical measurements. At the same time, it can perform dynamic, high-resolution, comprehensive characterisation of the sample's crystal structure, chemical components, and elemental valence. This greatly expands the function and application areas of the transmission.

This greatly expands the functions and application fields of transmission electron microscopy.

The in-situ STM-TEM integrated optical measurement system is an optical module integrated into the standard STM-TEM sample rod. Thus, it realises in-situ photoelectric measurements or spectroscopic characterisation studies in the transmission electron microscope.

Transmission electron microscope indicators:

• Compatible with specified electron microscope models and pole shoes;
• Optional dual-tilt version, dual-tilt electrical measurement sample rod Y-axis inclination ± 25 ° (at the same time limited by the pole shoe spacing);

Ensure the original resolution of the transmission electron microscope.

Electrical measurement index – Includes a current-voltage test unit:

• Current measurement range: 1 nA-30 mA, 9 ranges;
• Current resolution: better than 100 fA;
• Voltage output range: ±10 V in normal mode, ±150 V in high voltage mode;
• Automatic current voltage: (I-V) measurement, current-time (I-t) measurement, and automatic saving.

Scanning probe manipulation indicator:

• Coarse adjustment range: XY direction 2.5 mm, Z direction 1.5 mm;
• Fine adjustment range: 18 um in XY direction, 1.5 um in Z direction;
• Fine adjustment resolution: 0.4 nm in XY direction, 0.04 nm in Z direction.

Optical fibre index:

• Optical fibre outer diameter 250 um, to ensure the vacuum index of the electron microscope system;
• Optional fibre optic probe, flat head fibre, fibre optic lens;
• Optional SMA connector, FC connector.

Product Features

• The use of bi-directional optical fibre can be applied to CL spectroscopy, photoelectric detection, electroluminescence spectroscopy and other research.
• Optical integration solution with high expandability.
• High stability to ensure the original resolution of the electron microscope.

Ultra-long life: the patented technology (Patent Type: Utility Model (Electron Microscope In-situ Sample Rod with High Resolution Multi-dimensional Manipulation and Electrical Measurement) Patent No.: 202020944865.4) of the “claw-ball” structure of the probe rod is widely recognised as a solid and durable probe rod due to its unique structural design;

Ultra-low maintenance cost: the tip preparation system of the equipment can be used to prepare the tip consumables at a low cost.

The “claw-ball’ microstructure has been realised through modular mass production, with low maintenance costs.