Semiautomatic Stylus Profiler JS100C

Domestic semi-automatic stylus profiler JS100C/200C/300C, with high accuracy and high decomposition capability, with a one-piece granite structure, provides stable and reliable repeatability measurement.

JS100C provides two colour cameras to image the sample and the tip at the same time, which can observe the sample area without aberration, and it is convenient to locate the featured area. At the same time, you can observe the scanned area in real time when the probe is scanning.

Features

Accurate measurement, rich functionality, all-in-one integration, modular design, convenient after-sales service, and excellent cost performance.

Applications

  • Thickness measurements, such as etching, deposition, and thin films.
  • Measurement of surface parameters such as roughness and warpage of thin films and polysilicon.
  • Various types of thin films and other stress measurements
  • 3D scanning imaging
  • Scheduled task and multi-point scanning

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Prices shown are for the United Arab Emirates only and exclude VAT @ 5% Local Rate (Unless Otherwise Stated).
Other countries may incur additional import duties.

Please Contact Us for further details and pricing for your country or location.

Semiautomatic Stylus Profiler JS100C

Domestic semi-automatic stylus profiler JS100C/200C/300C, with high accuracy and high decomposition capability, with a one-piece granite structure, provides stable and reliable repeatability measurement.

JS100C provides two colour cameras to image the sample and the tip at the same time, which can observe the sample area without aberration, and it is convenient to locate the featured area. At the same time, you can observe the scanned area in real time when the probe is scanning.

Features

Accurate measurement, rich functionality, all-in-one integration, modular design, convenient after-sales service, and excellent cost performance.

Applications

  • Thickness measurements, such as etching, deposition, and thin films.
  • Measurement of surface parameters such as roughness and warpage of thin films and polysilicon.
  • Various types of thin films and other stress measurements
  • 3D scanning imaging
  • Scheduled task and multi-point scanning

System Components

Integrated Stylus Profiler

Options

Height calibration specimen

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