The world’s first and only commercially available electron back-scatter diffraction (EBSD) detector with unparalleled performance as low as 3 kV. This direct detection system is ideal for beam-sensitive perovskite, ceramic, or semiconductor materials that are difficult to analyze using conventional EBSD systems.
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This revolutionary series utilizes single-electron detection to provide the high-fidelity EBSD pattern quality and unparalleled sensitivity you expect to advance your research.
EDAX Clarity uses a groundbreaking hybrid-pixel direct detection technology with single-electron detection sensitivity. The incident electrons generate several electron-hole pairs within the silicon upon impact, and a bias voltage moves the charge toward the underlying CMOS detector, where it counts each event. This method is so sensitive that it can detect individual electrons not seen on conventional EBSD detectors that use phosphor screens or light transfer systems.
Coupled with zero read noise, the Clarity provides unprecedented sensitivity and image quality performance. It can successfully detect and analyze patterns comprised of less than 10 e-/pixel. This makes the Clarity ideal for beam-sensitive samples and low beam-dose applications like hybrid organic-inorganic perovskite solar cells and ceramics. Additionally, the Clarity Super is optimized for lower kV acquisition to improve the spatial resolution for fine-grained materials.
