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Ametek EDAX Velocity EBSD Camera Series

The EDAX Velocity™ EBSD camera series offers high-speed electron backscatter diffraction (EBSD) mapping with the best indexing performance on real-world materials. Powered by a CMOS sensor, the Velocity combines fast acquisition with high sensitivity and low noise performance for optimal collection and data quality.

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The EDAX Velocity™ EBSD camera series offers high-speed electron back-scatter diffraction (EBSD) mapping with the best indexing performance on real-world materials. Powered by a CMOS sensor, the Velocity combines fast acquisition with high sensitivity and low noise performance for optimal collection and data quality.

The EDAX Velocity camera series is available in four different models:

EDAX Velocity Ultra – Up to 6,700 indexed points per second (ipps)
EDAX Velocity Super – Up to 4,500 ipps
EDAX Velocity Plus – Up to 3,000 ipps
EDAX Velocity Pro – Up to 2,000 ipps

All models can achieve these speeds while providing up to 99% indexing success rates. EDAX’s proven Triplet Indexing routine provides orientation precision values of less than 0.1° without needing any specialized processing routines for accurate characterization of deformed micro-structures.

The performance of the Velocity camera extends to a wide range of materials, including lower symmetry, multi-phase, and deformed structures. The Velocity series enables efficient data collection on these real-world samples with the quality results needed for optimal materials analysis.

The Velocity EBSD cameras can integrate with compatible EDAX energy dispersive spectroscopy (EDS) detectors for efficient simultaneous EDS-EBSD collection, even at the highest collection speeds. When combined with ChI-Scan™ analysis, this results in useful integrated data for accurate phase differentiation.

Features and benefits of the EDAX Velocity EBSD Camera Series

Data collection rates up to 6,700 ipps

Collects EBSD maps in minutes for efficient scanning electron microscope (SEM) use, in-situ experiments, and 3D EBSD applications

High-speed, low-noise CMOS sensor

Provides high sensitivity, low noise images for EBSD indexing at the highest speeds

Orientation precision of less than 0.1°

Clear characterization of deformed microstructures with standard indexing routines

High indexing success rates

EDAX’s proven Triplet Indexing and patented Confidence Index provide unparalleled indexing performance on challenging real-world samples

High-speed simultaneous EDS-EBSD collection

The Velocity EBSD cameras have been optimized with compatible EDAX EDS detectors for efficient data collection at the highest speeds

EBSD orientation map from additively manufactured 316L was collected at 6,700 ipps with Velocity Ultra with a 99% indexing success rate.

Another EBSD map from additively manufactured Inconel 718 was collected at 4,500 ipps with Velocity Super with a 99% indexing success rate.

Orientation map from Inconel 600 was collected at 3,000 ipps with Velocity Plus with a 99% indexing success rate.

EBSD orientation map from deformed brass was collected at 2,000 ipps with Velocity Pro with a 99% indexing success rate.

Ametek EDAX Velocity EBSD Camera Series