CIQTEK FESEM – SEM4000Pro

Analytical Field Emission Scanning Electron Microscope (FESEM) with Large Beam I

The CIQTEK FESEM – SEM4000Pro is an analytical model of FE-SEM, equipped with a high-brightness and long-life Schottky field emission electron gun. The 3-stage electromagnetic lens design offers advantages in analytical applications such as EDS / EDX, EBSD, WDS, and more. It comes standard with a low vacuum mode and high-performance low vacuum secondary electron detector, as well as a retractable backscattered electron detector, which benefits the observation of poorly conductive or non-conductive specimens.

Key Features:

• Low Vacuum Mode
• High Resolution (0.9nm@30kV)
• Excellent Expandability
• *Specimen Exchange Loadlock (8-inches compatible)
• Three-stage Electromagnetic Lens
• Mechanical Eucentric Sample Stage

  * OPTIONAL EXTRA

Highlights:

▶ Low Vacuum Mode
Under low-vacuum mode, a range of 10-180 Pa can be reached without a pressure-limiting aperture. The specially designed objective lens vacuum chamber minimizes the electron mean free path in low vacuum conditions and achieves a resolution of 1.5 nm at 30 kV under low vacuum mode.

The secondary electron emission from the specimen surface ionizes air molecules and simultaneously generates electrons, ions, and photons. The generated electrons further ionize other air molecules, low-vacuum secondary electron detector (LVD) captures a large amount of photon signals produced in such a process.
The incident electron beam ionizes air molecules on the specimen surface, generating electrons and ions. These ions neutralize the surface’s charging, thus reducing the charging effect.

▶ Particle & Pore Analysis Software (Particle) *Optional
The CIQTEK SEM Microscope software employs various target detection and segmentation algorithms, suitable for different types of particle and pore samples. it enables quantitative analysis of particle and pore statistics and can be applied in fields such as materials science, geology, and environmental science.

▶ Image Post-processing Software *Optional
Perform online or offline image post-processing on images captured by electron microscopes and integrate commonly used EM image processing functions, convenient measurement, and annotation tools.

▶ Auto Measure *Optional
Automatic recognition of line width edges, resulting in more accurate measurements and higher consistency. Support multiple edge detection modes like Line, Space, Pitch, etc. Compatible with multiple image formats and equipped with various commonly used image post-processing functions. The software is easy to use, efficient, and accurate.

▶ Software Development Kit (SDK) *Optional
Provide a set of interfaces for controlling the SEM microscope, including image acquisition, operating condition settings, power on/off, stage control, etc. Concise interface definitions allow for the rapid development of specific electron microscope operation scripts and software, enabling automated tracking of regions of interest, industrial automation data acquisition, image drift correction, and other functions. It can be used for software development in specialized areas such as diatom analysis, steel impurity inspection, cleanliness analysis, raw material control, etc.

▶ AutoMap *Optional