Ciqtek – Ultra-high Res FESEM | SEM5000X

CIQTEK SEM5000X

Ultra-high Resolution Field Emission Scanning Electron Microscopy (FESEM) Challenges the Limits

The CIQTEK SEM5000X is an ultra-high resolution FESEM with optimized electron optics column design, reducing overall aberrations by 30%, achieving ultra-high resolution of 0.6 nm@15 kV and 1.0 nm@1 kV. Its high resolution and stability make it advantageous in advanced nano-structural materials research, as well as the development and manufacturing of high-technology node semiconductor IC chips.

Key Features:

  • Breakthrough Resolving Power
  • Mechanical Eucentric Specimen Stage
  • (Optional)Dual Beam Deceleration Mode (Duo-Dec)
  • (Optional) Specimen Exchange Loadlock (8 inches compatible)
  • High Stability
  • Excellent Expandability

AVAILABLE IN STOCK

Prices Start From Call for price

Prices shown are for the United Arab Emirates only and are excluding VAT @ 5% Local Rate (Unless Otherwise Stated).

Other countries may incur additional import duties – Please Contact Us for further details and pricing for your location.

CIQTEK SEM5000X

Ultra-high Resolution Field Emission Scanning Electron Microscopy (FESEM) Challenges the Limits

The CIQTEK SEM5000X is an ultra-high resolution FESEM with optimized electron optics column design, reducing overall aberrations by 30%, achieving ultra-high resolution of 0.6 nm@15 kV and 1.0 nm@1 kV. Its high resolution and stability make it advantageous in advanced nano-structural materials research, as well as the development and manufacturing of high-technology node semiconductor IC chips.

Key Features:

  • Breakthrough Resolving Power
  • Mechanical Eucentric Specimen Stage
  • (Optional)Dual Beam Deceleration Mode (Duo-Dec)
  • (Optional) Specimen Exchange Loadlock (8 inches compatible)
  • High Stability
  • Excellent Expandability
CIQTEK SEM5000X FESEM Microscope Specifications
Electron Optics Resolution 0.6 nm @ 15 kV, SE
1.0 nm @ 1 kV, SE
Acceleration Voltage 0.02kV ~30 kV
Magnification 1 ~ 2,500,000 x
Electron Gun Type Schottky Field Emission Electron Gun
Specimen Chamber Cameras Dual Cameras (optical navigation + chamber monitor)
Stage Type 5-Axis Mechanical Eucentric Specimen Stage
Stage Range X=110 mm, Y=110 mm, Z=65 mm
T: -10*~+70°, R: 360°
SEM Detectors and Extensions Standard In-lens Detector
Everhart-Thornley Detector (ETD)
Optional Retractable Back-Scattered Electron Detector (BSED)
Retractable Scanning Transmission Electron Microscopy Detector (STEM)
Low Vacuum Detector (LVD)
Energy Dispersive Spectrometer (EDS / EDX)
Electron Backscatter Diffraction Pattern (EBSD)
Specimen Exchange Loadlock (4 inch / 8 inch)
Trackball & Knob Control Panel
Duo-Dec mode (Duo-Dec)
User Interface Languages English
Operating System Windows
Navigation Optical Navigation, Gesture Quick Navigation, Trackball (optional)
Automatic Functions Auto Brightness & Contrast, Auto Focus, Auto Stigmator

Request A Quotation...

Please fill Out Your Details & Any Special Requests