CIQTEK Tungsten Filament SEM3300

Next-generation Tungsten Filament Scanning Electron Microscope

The CIQTEK Tungsten Filament SEM3300 scanning electron microscope (SEM) incorporates technologies such as “Super-Tunnel” electron optics, in-lens electron detectors, and electrostatic & electromagnetic compound objective lenses. By applying these technologies to the tungsten filament microscope, the long-standing resolution limit of such SEM is surpassed, enabling the tungsten filament SEM to perform low-voltage analysis tasks previously only achievable with field emission SEMs.

Key Features:

• Break Through the Resolution Limit of Tungsten Filament SEMs
• In-lens Electron Detector
• Electromagnetic & Electrostatic Combo Objective Lens
• Safer to Use
• Excellent Expandability

▶ Optical Navigation
Using a vertically mounted chamber camera to capture optical images for specimen stage navigation allows for a more intuitive and accurate specimen positioning.

▶ Auto Functions
Improved Automatic Brightness & Contrast, Automatic Focus, and Automatic Astigmatism Correction Functions. Imaging by a single click!

▶ Safer to Use

• Infrared CCD – Real-time chamber interior motion monitoring using image recognition and motion capture technology.
• Anti-collision (Software) – Manually input the sample height to accurately define the distance between the sample and the objective lens to prevent collisions.
• Anti-collision (Hardware) – Shut off the power to the stage motor at the moment of collision to minimise damage.

▶ Easy Filament Replacement
Pre-aligned replacement filament module ready to use.