The EDAX Octane Elite EDS system offers game-changing advancements with Octane Elite silicon drift detectors (SDDs) that take energy dispersive spectroscopy (EDS) analysis to the next level. This system includes detectors with a silicon nitride (Si3N4) window, offering remarkable improvements in low energy sensitivity for light element detection and low kV microanalysis. The Octane Elite detectors also use high-speed X-ray data processing technology within a smaller and fully vacuum-encapsulated detector device.
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EMCRAFTS CUBE-II PACKAGE – Link Gulf are proud to offer this versatile SEM solution package from our stock here in the UAE, with fast delivery and installation to your site.
The desktop system includes the core EMCrafts CUBE-II desktop SEM unit along with the leading edge EDS/EDX Octane Elite from Ametek EDAX.
The EMCRAFTS CUBE-II PACKAGE includes:
EMCrafts CUBE II Series:
Automatic Functions To Minimize Repetitive Tasks – Auto Focus, Auto Brightness & Contrast, Auto Gun Alignment, Auto Saturation
High Resolution Imaging – 5.0nm (SE Image) / 6.0nm (BSE Image)
Rapid analysis by exchanging specimen within 90 sec – Vacuum ready within 90 sec – Ventilation ready within 10 sec
4CH BSED as a basic option(Combo, Topo)
Various kinds of specimens can be analyzable with optional detectors – EDS (All-in-one Model of SEM-EDS) *Oxford, Bruker, EDAX, Thermo compatible, Auto Rotation, Auto Tilt, Chamber Camera, Navigation
SEM is widely used across various fields to produce unprecedented images of the microscopic and nanometric world.
Our family of SEM models are widely used in research fields and industry applications such as semiconductors, flat-panel displays, and nanotechnology labs.
Quality control of electronics circuits and semiconductor parts.
Observation of microstructure of Secondary cell, CNT (Carbon nanotube), Solar Cell, Wafer, Bonding Wire, LED and Nanotech.
The silicon nitride window offers significant improvements compared to a polymer window, improving light element performance and significantly more critical data for the analyst.
The silicon nitride window offers superior low-energy transmission compared to a polymer window.
The mechanical properties of Si3N4 allow the use of thinly fabricated windows, offering a great benefit in terms of sensitivity and optimal low-voltage analysis.
EDAX EDS systems with advanced detection electronics offer the highest throughput count rates on the market for the best possible analysis and increased productivity.
The material properties and durability of Si3N4 ensure the most robust and reliable detectors available for all EDS applications.
The motorized slide offers complete control of the detector via the software and is optimal for analytical flexibility. It is ideal for all focused ion beam (FIB) systems.
APEX™ ensures high-quality, accurate results and increased productivity with its easy-to-use interface, live-time graphical display, and simultaneous review mode.
| EMCrafts CUBE II Series: | |||
| Stage | 5-axis Stage | ||
| -X: 42mm (Motorized) | |||
| -Y: 42mm (Motorized) | |||
| -Z: 5 ~ 53mm (Motorized) | |||
| -T: -90° ~ 90° (Manual) | |||
| -R: 360° (Beam Rotation) | |||
| Vacuum Mode | High Vacuum Mode (<9×10-3 Pa) | ||
| Charge Reduction Mode | |||
| Vacuum System | -Fully Automated Evacuation System | ||
| -Turbo molecular pump (Vacuum ready within 90 seconds) | |||
| -Rotary vane pump | |||
| -Electrical valve system | |||
| Electron Gun | Pre-centered Tungsten Filament | ||
| Detector | SE Detector 4CH BSE Detector | ||
| Resolution | 5.0nm (SE Image at 30kV) | ||
| Magnification | x10 ~ x200,000 | ||
| Acceleration Voltage | 1kV ~ 30kV | ||
| Image Shift | 100μm | ||
| Maximum Sample Size | Horizontal: 140mm; Vertical: 80mm | ||
| Working Distance | 5 ~ 53mm | ||
| Sample loading Time | 90 sec (Vacuum) 10 sec (Vent) | ||
| Automatic Function | Auto Brightness & Contrast, Auto Focus, Auto Gun Alignment, Auto Saturation, Auto Filament, Bias | ||
| Image Format | JPG, TIFF, BMP, PNG | ||
| Display Mode | Focus Mode : 320 x 240 pixel, Resizable | ||
| Preview Mode: 800 x 600 | |||
| Slow Mode: Applicable to both preview and focus mode | |||
| Photo Mode: Up to 3200 x 2400 | |||
| Dimension(mm) | W x D x H = 410mm x 440mm x 520mm, 65kg | ||
| Operation Device(PC) | Windows 10-based All-in-One 21.5” Workstation, 100% controlled by keyboard and mouse | ||
| Optional Devices | EDS (All-in-one Model of SEM-EDS), Auto Rotation, Auto Tilt, Chamber Camera, Navigation | ||
| *Oxford, Bruker, EDAX, Thermo compatible | |||
| Power Supply | Single Phase : 100 ~ 240VAC, 50 / 60Hz, 1kVA | ||
