PicoFemto in-situ TEM High-Temperature Mechanics Measurement system integrates both a mechanical measurement module and a MEMS chip module, allowing quantitative mechanical measurements to be performed while the sample is heated up to 1000 ℃. The MEMS chip module can be equipped with a choice of either a heating chip or an electrical measurement chip.
The mechanical measurement module can choose different load sensors to meet different experimental needs.
This product realises the real sense of high-resolution quantitative in-situ high-temperature mechanics research in transmission electron microscopy.
Some models of electron microscopes can be selected with a double-tilt version, double-tilt electrical measurement sample rod Y-axis inclination ± 25 °; (at the same time, limited by the pole shoe spacing);
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PicoFemto in-situ TEM TEM-STM Low Temperature Electrical Measurement System is a standard shape transmission electron microscope sample rod.
Equipped with a scanning probe control unit, the probe can manipulate individual nanostructures and perform electrical measurements, while simultaneously enabling dynamic, high-resolution, comprehensive characterisation of the sample’s crystal structure, chemical composition, and elemental valence, greatly expanding the transmission’s function and application areas.
This greatly expands the functions and application fields of transmission electron microscopy.
The in-situ STM-TEM low-temperature electrical measurement system integrates a low-temperature environment control unit on the standard STM-TEM sample rod, thus realising the purpose of in-situ low-temperature electrical measurements in the transmission electron microscope.
Transmission electron microscope indicators:
Ensure the original resolution of the transmission electron microscope.
Electrical measurement index: Includes a current-voltage test unit;
Current measurement range: 1 nA-30 mA, 9 ranges;
Current resolution: better than 100 fA;
Voltage output range: ±10 V in normal mode, ±150 V in high voltage mode;
Automatic current-voltage (I-V) measurement, current-time (I-t) measurement, and automatic saving.
Scanning probe manipulation indicator
Coarse adjustment range: XY direction 2.5 mm, Z direction 1.5 mm;
Fine adjustment range: 18 um in XY direction, 1.5 um in Z direction;
Fine adjustment resolution: 0.4 nm in XY direction, 0.04 nm in Z direction.
Low temperature parameter index: Compatible with the specified type of transmission electron microscope and pole shoe;
High stability: easy to obtain high-resolution images in large-scale motion, suitable for a wider range of application scenarios and sample systems;
Ultra-long life: the patented technology “claw-ball” structure of the probe rod is widely recognised as a robust and durable probe rod due to its unique structural design;
Ultra-low maintenance cost: the tip preparation system of the equipment can be used to prepare the tip consumables at low cost.” The “claw-ball” micromotion structure has been realised through modular mass production, with low maintenance costs.
PicoFemto in-situ TEM TEM-STM Low Temperature Electrical Measurement System is a standard shape transmission electron microscope sample rod.
Equipped with a scanning probe control unit, the probe can manipulate individual nanostructures and perform electrical measurements, while simultaneously enabling dynamic, high-resolution, comprehensive characterisation of the sample’s crystal structure, chemical composition, and elemental valence, greatly expanding the transmission’s function and application areas.
This greatly expands the functions and application fields of transmission electron microscopy.
The in-situ STM-TEM low-temperature electrical measurement system integrates a low-temperature environment control unit on the standard STM-TEM sample rod, thus realising the purpose of in-situ low-temperature electrical measurements in the transmission electron microscope.
