Oxford Instruments – Symmetry S3 EDSD Detector

Symmetry S3, the world’s first EBSD detector based on CMOS sensor technology, is set to revolutionise EBSD analysis.

The Symmetry S3 is the only genuine all-in-one EBSD detector on the market, and is based on the revolutionary Symmetry detector, the world’s first EBSD detector to utilise advanced CMOS technology. Exceptional performance for all EBSD applications is combined with ease of use and a range of innovative design features.

Highlights include:

  • Guaranteed indexing speeds in excess of 5700 pps at 156 x 128 pixel EBSD pattern resolution
  • 1244 x 1024 pixel resolution – ideal for high angular resolution (HR) EBSD
  • Unique fibre-optic coupling with sub-pixel distortion
  • Extreme sensitivity, benefiting all types of analysis
  • Software-controlled detector tilting

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Symmetry S3, the world’s first EBSD detector based on CMOS sensor technology, is set to revolutionise EBSD analysis.

The Symmetry S3 is the only genuine all-in-one EBSD detector on the market, and is based on the revolutionary Symmetry detector, the world’s first EBSD detector to utilise advanced CMOS technology. Exceptional performance for all EBSD applications is combined with ease of use and a range of innovative design features.

Highlights include:

  • Guaranteed indexing speeds in excess of 5700 pps at 156 x 128 pixel EBSD pattern resolution
  • 1244 x 1024 pixel resolution – ideal for high angular resolution (HR) EBSD
  • Unique fibre-optic coupling with sub-pixel distortion
  • Extreme sensitivity, benefiting all types of analysis
  • Software-controlled detector tilting

Symmetry S3 uses a customised CMOS sensor and fibre optics to unlock a unique and powerful combination of speed, sensitivity, and diffraction pattern detail. The S3, in combination with the AZtec software, delivers exceptional performance on all materials and for all measurements.

The highest analysis speed of the Symmetry S3, in excess of 5700 pps, enables texture and grain size characterisation in a matter of seconds, yet this is achieved without requiring high beam currents or sacrificing pattern resolution. This means that these high speeds can be achieved even on challenging, real-world samples such as multiphase light metal alloys or deformed steels.

In addition, the Symmetry S3 can collect distortion-free, megapixel resolution EBSPs for detailed strain and phase analyses. This is a detector to suit all applications, enhanced by innovative features such as software-controlled tilting (with dynamic calibration) and a unique proximity sensor.

When an EBSD detector has no compromise, no application is beyond your reach. This was recently recognised, as the Symmetry was awarded the King’s Award for Enterprise in Innovation.

Features

The Symmetry S3 detector has an outstanding performance coupled with ease of use, making it the ideal detector for all EBSD applications:

  • Guaranteed indexing speeds > 5700 patterns per second (pps)
  • Fibre-optic lens delivering unrivalled sensitivity
  • Highest sensitivity > 1000 pps / nA
  • 156 x 128 pixel resolution at maximum speed
  • Full megapixel resolution (1244 x 1024) patterns – ideal for high angular resolution (HR)-EBSD strain analyses
  • Sub-pixel distortion, ensuring an angular precision below 0.05°
  • Software-controlled tilting interface coupled with autocalibration – perfect positioning and indexing for all sample sizes and geometries
  • Unique proximity sensor – detects potential collisions before they happen and automatically moves the detector to a safe position
  • Five integrated forescatter detectors (optional), providing full colour complementary channelling contrast and atomic number contrast images.
  • Bellows SEM interface, maintaining the microscope’s vacuum integrity
  • Simple and intuitive detector settings, ensuring optimum results every time
Software

The performance of the Symmetry S3 detector is enabled by the powerful AZtecHKL acquisition platform, backed up by the fastest and most modern EBSD data processing software, AZtecCrystal. The comparison table below will help you choose the best software package to deliver the flexibility and functionality that you require.

SOFTWARE OPTIONS

Feature Description AZtecHKL AZtecHKL AZtecHKL
Standard Advanced Expert
AZtec EBSD Mapping Point Analyses, LineScans and Maps
ReAnalysis Reprocess datasets with stored patterns
AZtec Synergy Fully integrates Oxford Instruments EDS & EBSD systems with simultaneous EDS and EBSD maps /linescans
AZtec PhaseID dth=”373″>Combines EDS & EBSD data to identify unknown phases
AZtec Image Registration Register and use an image for specimen navigation
TKD Navigator Dedicated workflow for transmission Kikuchi diffraction (TKD)
AZtec Data Analysis Data Clean, Grain Detection & Size Analysis, Map Editor
AZtecCrystalStandard Modern, standalone EBSD data processing software incl. maps, pole/inverse pole figures, ODFs and grain analysis
AZtec TruPhase Real-time differentiation of similar crystal structures using EDS O
AZtec Autolock Predictive and reactive specimen drift correction O
Colour FSD Colour visualisation of orientation images using forescatter detectors O
PseudoSymmetry Solves orientation measurements in materials where different orientations deliver similar EBSPs O
AZtecHKL Steel Reclassify phase tool for phase separation and a dedicated steel phase database O
AZtecCrystal Advanced Comprehensive standalone data processing package, incl. materials properties, parent grain reconstruction and advanced dislocation analysis O
AZtecCrystal MapSweeper Dataset enhancement tools based on pattern simulation and pattern matching routines O O
AZtec Large Area Mapping Acquire and stitch multiple fields to characterise large sample areas O O
AZtec MapQueue Schedule acquisition of multiple experiments O O
CIF Import Import Crystal Information Files for phase definition O O
Magnetic Field Correction Correct EBSD pattern distortion from immersion lens fields O O O
AZtec 3D Automated acquisition of 3D datasets on compatible FIB-SEMs O O

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