PicoFemto in-Situ TEM TEM-STM Integrated Force Measurement System is a scanning probe control unit added to the standard shape of the TEM sample rod through the probe.

Manipulating individual nanostructures and electrical measurements, and electrical measurements can be made at the same time, dynamic, high-resolution, comprehensive characterisation of the sample’s crystal structure, chemical components, and elemental valence.

This greatly expands the functions and application fields of transmission electron microscopy.

The transmission electron microscope in-situ STM-TEM force-electricity measurement system integrates a nano-nano force sensor inside the standard STM-TEM sample rod to realise high-precision mechanical and electrical measurements.

Performance Indicators

Transmission electron microscope indicators:

• Compatible with specified electron microscope models and pole shoes
• Optional dual-tilt version, dual-tilt electrical measurement sample rod Y-axis inclination ± 25 ° (while limited by the pole shoe spacing)
• Ensure the original resolution of the transmission electron microscope

Electrical measurement index:

• Includes a current-voltage test unit
• Current measurement range: 1 nA-30 mA, 9 ranges
• Current resolution: better than 100 fA
• Voltage output range: ±10 V in normal mode, ±150 V in high voltage mode
• Automatic current-voltage (I-V) measurement, current-time (I-t) measurement, and automatic saving.

Scanning probe manipulation indicator:

• Coarse adjustment range: XY direction 2.5 mm, Z direction 1.5 mm
• Fine adjustment range: 18 um in XY direction, 1.5 um in Z direction
• Fine adjustment resolution: 0.4 nm in XY direction, 0.04 nm in Z direction

Mechanical sensor index:

• Cantilever beam elasticity range 1 N/m~100 N/m
• Load resolution better than 5 nN (when using 1 N/m cantilever beam)
• Automatic force-distance curve measurement and automatic saving

Product Features

• Ensure that the original resolution of the electron microscope, even in the spherical aberration, can capture a clear atomic image.
• Good manoeuvring stability, piezoelectric ceramic drive mode, to ensure high-precision manoeuvring. The sample rod has high stability, and the probe moves smoothly, enabling high-resolution in-situ observation experiments.
• Easy to operate, friendly and easy to operate software interface. The controller integrates current and voltage test units to meet most experimental needs. Displacement coarse and fine adjustment of the whole software operation.
• Force and electricity integrated solution, mechanical and electrical configuration to meet most of the testing needs.

Ultra-long life: Patented technology (Patent Type: Utility Model (Electron Microscope In-situ Sample Rod with High Resolution Multi-dimensional Manipulation and Electrical Measurement) Patent No.: 202020944865.4) “claw-ball” structure of the probe rod, due to its unique structural design, is recognised as a solid and durable probe rod.

Ultra-low maintenance cost: the tip preparation system of the equipment can be used to prepare the tip consumables at a low cost. The “claw-ball” microstructure has been realised through modular mass production, with low maintenance costs.