FRINGE PLUS X-Ray Diffractometer
Small footprint, high power. Limited space, limitless performance.
FRINGE PLUS Benchtop X-ray Diffractometer is a next-generation benchtop X-ray diffraction system. It integrates advanced hardware with intelligent software. This system is designed to deliver high-precision and high-efficiency testing solutions for material analysis and industrial quality control.
Featuring a diffraction radius of ≥200 mm, a maximum output power of 3.0 kW, and the Xeye2D 2D detector, the FRINGE PLUS enables high angular resolution, high count rate, and an excellent signal-to-noise ratio. The accompanying CrystalX intelligent analysis software automatically performs phase identification, quantitative analysis, crystal structure analysis, and crystallinity determination with simple operation. As a result, the system is suitable for a wide range of fields including materials research, construction materials, metals, minerals, pharmaceuticals, and semiconductors.
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FRINGE PLUS X-Ray Diffractometer
Small footprint, high power. Limited space, limitless performance.
FRINGE PLUS Benchtop X-ray Diffractometer is a next-generation benchtop X-ray diffraction system. It integrates advanced hardware with intelligent software. This system is designed to deliver high-precision and high-efficiency testing solutions for material analysis and industrial quality control.
Featuring a diffraction radius of ≥200 mm, a maximum output power of 3.0 kW, and the Xeye2D 2D detector, the FRINGE PLUS enables high angular resolution, high count rate, and an excellent signal-to-noise ratio. The accompanying CrystalX intelligent analysis software automatically performs phase identification, quantitative analysis, crystal structure analysis, and crystallinity determination with simple operation. As a result, the system is suitable for a wide range of fields including materials research, construction materials, metals, minerals, pharmaceuticals, and semiconductors.
3 kW high power output significantly enhances XRD signal intensity and signal-to-noise ratio. It greatly increases measurement speed while enabling effective detection of weakly diffracting or trace samples.
Equipped with the Xeye2D detector, supports seamless switching between zero-dimensional, one-dimensional, and two-dimensional modes, delivering exceptionally high diffraction intensity.
The integrated design combines a compact footprint with high power. This improves space efficiency while achieving performance comparable to floor-standing XRD systems.
With 3 kW output power, it significantly enhances diffraction signal intensity. Therefore, it is particularly suitable for weakly diffracting samples and fast scanning scenarios. It reduces measurement time while ensuring data quality.
Equipped with the Xeye2D detector, it can seamlessly switch between zero-dimensional, one-dimensional, and two-dimensional modes. It also exhibits extremely high diffraction intensity, which can flexibly adapt to different sample testing needs.
Adopting the design concept of “desktop-level size, floor-standing performance”, it integrates professional XRD capabilities into ordinary office environments with a highly integrated design. The compact body can be placed on the desktop, greatly improving space utilisation.
Equipped with a wide range of sample stage accessories, including rotating sample stages, temperature accessories, knife-edge accessories, battery accessories, and more, providing flexible and diverse sample analysis solutions. This helps meet the needs of samples with different morphologies, sizes, and testing requirements. As a result, it helps you explore material characteristics more comprehensively and deeply.
Capable of performing phase identification, crystal structure analysis, residual stress analysis, texture analysis, and more on various sample types including powders, thin films, bulk materials, and liquids. Therefore, it meets diverse research and industrial needs.
The CrystalX software features a clean and intuitive user interface with well-organised functional modules, allowing even first-time users to quickly get started. Complex training is not required to easily complete sample testing, data acquisition, and analysis. As a result, it significantly improves work efficiency.
The software offers one-click testing and analysis functionality. Users only need to set a few key parameters to initiate the entire testing process, from sample scanning to data result presentation, fully automated. This minimises manual intervention and reduces the possibility of operational errors.
The software includes a large and comprehensive standard diffraction pattern database, covering diffraction data for various common substances. This database is regularly updated to ensure accurate phase identification and matching. Furthermore, the software supports user-defined additions and editing of the database. Therefore, users can expand its content according to their research areas and needs.
Equipped with a built-in standard database and intelligent matching functionality, it automatically compares diffraction patterns against the built-in standard substance database. This enables fast and accurate qualitative phase analysis.
| FRINGE Family (Benchtop) | FRINGE PLUS |
| Goniometer | θ-θ vertical goniometer, diffraction circle radius ≥200 mm |
| 2θ Measuring range | -3° – +150° |
| Precision | The deviation of ＜±0.02° in the full spectrum |
| FWHM | <0.04°2θ |
| Sola slit | The integrated sora slits, without any motion-adjustable parts, increase the reliability of the goniometer system |
| X-Ray tube | X-ray tube, metal-ceramic or corrugated ceramic tube, focal spot: (1 × 10) mm², default configuration: Cu target |
| Detector | Xeye2D |
| a) Hybrid pixel photon-counting detector, with no fewer than 65,536 sub-pixels and a pixel size no larger than 55 μm; | |
| b) Photosensitive chip size: ≥14 × 14 mm; | |
| c) Dynamic range: ≥1 × 10⁷ cps; | |
| d) Detection modes: seamless switching between zero-dimensional, one-dimensional, and two-dimensional modes; | |
| e) Energy resolution capability: automatic fluorescence background removal without the need for a monochromator. | |
| High Voltage Generator Power | The maximum output power of the high voltage generator is 3000W |
| Size | 765mm x 565mm x 955mm（L×W×H） |
| Weight | About 170 kg (depending on the actual configuration) |
| Power Supply | 220V±10V, 50Hz |
| Heat dissipation | External recirculating water cooling system |
| Interface | The compact home wall plug provides power, and the USB interface connects to the PC for controlling the XRD |
| Air source | A 2-way air supply interface is available for in-situ analysis or atmosphere protection |
| Security | The push-pull chamber door effectively shields X-rays. FRINGE PLUS is equipped with automatic cut-off protection and a safety interlock device. When the sample chamber is closed, it is fully enclosed, and the operation interface provides an indicator showing that the sample chamber is closed. |
| CrystalX software | LANScientific has developed a special crystal analysis software CrystalX for FRINGE PLUS. After obtaining diffraction data, CrystalX automatically conduct phase analysis, and give the percentage of each component of the phase, greatly reducing the requirements of the user, no manual retrieval, no need to buckle the background, no need to smooth, no need to manually peak, just need to click “start testing”, the rest to the CrystalX software |
