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FRINGE C1600 X-Ray Diffractometer
A good helper for phase analysis.
X-Ray diffraction uses the diffraction phenomenon of X-rays in the crystal to obtain the X-Ray signal characteristics after diffraction and to obtain the diffraction pattern after processing. It is a research method to obtain information such as the composition of the material, the structure or morphology of the atoms or molecules inside the material by X-Ray diffraction and analysis of its diffraction pattern.
FRINGE C1600 can quickly perform the following analyses on samples in powder, bulk or film form:
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FRINGE C1600 X-Ray Diffractometer
A good helper for phase analysis.
X-Ray diffraction uses the diffraction phenomenon of X-rays in the crystal to obtain the X-Ray signal characteristics after diffraction and to obtain the diffraction pattern after processing. It is a research method to obtain information such as the composition of the material, the structure or morphology of the atoms or molecules inside the material by X-Ray diffraction and analysis of its diffraction pattern.
FRINGE C1600 can quickly perform the following analyses on samples in powder, bulk or film form:
Patented new θ-2θ linkage goniometer system, single-axis drive mechanism. It is precise and simple, with excellent performance.
The instrument adopts digital multichannel analysis technology. The diffraction peak and fluorescence interference can be distinguished without monochromator, and the diffraction intensity can be improved.
It has automatic cutting protection device in the test process, safety linkage lock device, the sample chamber is fully enclosed after closing, and the operation interface has the function of closing the sample chamber.
After obtaining diffraction data, CrystalX automatically carry out phase analysis, and give the percentage of each component of the phase, greatly reducing the requirements of the user, just need to click “start testing”, the rest to the CrystalX software.
The integrated sola slits, without any motion-adjustable parts, increase the reliability of the goniometer system. This allows the FRINGE C1600 XRD to be installed on in-vehicle laboratory platforms.
Digital multi-channel analysis technology can distinguish diffraction peak and fluorescence interference without monochromator, and improve diffraction intensity.
| FRINGE Family (Benchtop) | FRINGE C1600 |
| Goniometer | θ-2θ linkage vertical goniometer, diffractive circle radius 150mm |
| 2θ Measuring range | -3° – +150° |
| Precision | The deviation of <±0.02° in the full spectrum |
| FWHM | <0.04°2θ |
| Sora slit | The integrated Sora slits, without any motion-adjustable parts, increase the reliability of the goniometer system, allowing the FRINGE desktop XRD to be installed on in-vehicle laboratory platforms |
| X-Ray Tube | Cermet X-ray tube, with maximum power of 2.2KW, focus:(1×10 )mm2, default configuration cu target, optional Co, Cr, Mo target |
| High voltage generator power | 1200W, maximum tube voltage 40KV, maximum tube current 30mA. |
| Size | 580mm x 450mm x 680mm(L×W×H) |
| Weight | About 120 kg(depending on the actual configuration) |
| Power supply | 220V±10V, 50Hz |
| Heat dissipation | FRINGE C1600 uses an external water circulation cooling system to cool the surging power powerfully |
| Detector | DPPC detector |
| Interface | The compact home wall plug provides power, and the USB interface connects to the PC for controlling the XRD |
| Air source | A 2-way air supply interface is available for in-situ analysis or atmosphere protection |
| Security | The FRINGE C1600 has an air spring large window lift door, which can observe the in-situ analysis process without dead angle, and can effectively shield X-rays. It has a protection and safety interlock device that automatically cuts off during the test process. The operation interface has the function of closing the sample compartment |
| Cloud service capabilities | FRINGE C1600 uses a synchronizable mobile APP service to support card management of diffraction data and access to knowledge management systems |
| CrystalX software | LANScientific has developed a special crystal analysis software CrystalX for FRINGE C1600. After obtaining diffraction data, CrystalX automatically conduct phase analysis, and give the percentage of each component of the phase, greatly reducing the requirements of the user, no manual retrieval, no need to buckle the background, no need to smooth, no need to manually peak, just need to click “start testing”, the rest to the CrystalX software |