SHINE Research Edition X-Ray Diffractometer
SHINE portable X-Ray diffractometer is a portable X-Ray diffractometer independently developed by LANScientific. It combines XRD, XRF, and computer software technologies. The samples are analysed by the X-Ray diffraction instrument, and the diffraction pattern is examined.
This reveals material composition and internal information such as atomic or molecular structure or form (material ingredient, the secondary ingredients or trace elements of the crystal phase ID information). Moreover, it offers simple sample preparation and produces no pollution.
It is quick and highly precise in measurement. You can obtain a lot of information about the integrity of the crystal. It is the main method to study the phase and crystal structure of matter.
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SHINE Research Edition X-Ray Diffractometer
SHINE portable X-Ray diffractometer is a portable X-Ray diffractometer independently developed by LANScientific. It combines XRD, XRF, and computer software technologies. The samples are analysed by the X-Ray diffraction instrument, and the diffraction pattern is examined.
This reveals material composition and internal information such as atomic or molecular structure or form (material ingredient, the secondary ingredients or trace elements of the crystal phase ID information). Moreover, it offers simple sample preparation and produces no pollution.
It is quick and highly precise in measurement. You can obtain a lot of information about the integrity of the crystal. It is the main method to study the phase and crystal structure of matter.
SHINE uses transmission geometry technology to direct the X-Ray beam through the sample location. The micro-focus X-ray tube emits an X-ray beam through the collimator, and this beam irradiates the powder particles in the sample pool. The unique vibration system exposes more of the crystal powder particles to the X-Ray beam. When these particles meet Bragg’s law, the CCD acquires the diffraction pattern through the phenomenon of diffraction.
The sample size in the sample pool is fixed, so changes in sample density do not affect the resolution. Notably, this feature is especially important for low-density materials, such as drug samples. For such materials, higher resolution can be achieved with fixed penetration compared to instruments based on reflective geometry.
The instrument adopts a waterproof and dustproof box all-in-one machine design, without any mechanical moving parts. It is light and compact, so it is easy to carry. You can freely conduct laboratory or field scientific research.
XRD is integrated with XRF technology, and X-Ray photon data of BOTH XRD and XRF can be collected at the same time during each test. As a result, this provides material composition, phase and structure information. Thus, it promotes more accurate test results.
No need for calibration, automatic detection. Real-time display of full spectrum diffraction, automatic phase analysis, one key to generate quantitative results.
A single analysis only needs about 20 mg of sample to obtain high quality test results. Sample preparation can be completed in 3 minutes (crushing, filtering and sampling) without making, pressing and scraping equal.
The instrument realizes high-speed connection with laptop computer through USB, Bluetooth, WIFI, real-time control and phase analysis of SHINE.
Professional multiple protective radiation treatment, no radiation leakage in all directions when measuring instrument.
| SHINE Family (Portable) | SHINE Research Edition |
| XRD resolution | 0.2°@2θ FWHM |
| 2θ Measuring range | 5-55°2θ |
| Diffraction Geometry | Debye-Scherrer Transmission Geometry |
| The detector | 2000 X 256 pixel, 2d, level 3 Pelter refrigeration CCD |
| X-ray tube target | Cluster microfocal spot X-ray tube, Cu or Co, Cr, Fe, Ni, Mo, Ag, W target (optional according to test sample) |
| X-ray tube voltage | Maximum 50kV, 0-50kV adjustable |
| X-ray tube power | Maximum 40W, 0-40W adjustable |
| XRF energy resolution | 127eV@8keV |
| XRF detection range | Mg—U |
| Cooling method | Water Cooling |
| Sample particle size | Sample particle <150um (100 mesh sieve) |
| Sample weight | About 20mg |
| Working temperature | -10°C-35°C |
| Weight | 15KG |
| The power supply | Lithium-ion battery or power adapter |
| Size | 50mm×40mm×188mm（L×W×H） |
| CrystalX analysis software language | Chinese, English and other languages |
