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SHINE Metal Corrosion Edition
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SHINE Metal Corrosion Edition
Basic principles of X-Ray diffraction: When a beam of monochromatic X ray incident on a crystal, because the crystal is made up of atomic rules are arranged into a cell, the distance between the atoms and the incident X-Ray wavelength with the same order of magnitude.
Therefore, due to the different atomic scattering X-Ray mutual interference, resulting in stronger effects occurring in some special directions. In X-ray diffraction, the diffraction lines in the spatial distribution of location and intensity are closely related to the crystal structure.
In the industrial field, different devices have different operating environments and contact with different media. As a result, the causes of corrosion of equipment vary widely.
Corrosion will seriously affect its service life, and even cause resource leakage and environmental pollution. In the past, the maintenance team needed to send samples that would corrode away from the scene to the laboratory for analysis. This process was time consuming and high-cost.
Mirror SHINE portable X-Ray diffractometer (metal corrosion edition) is an on-site testing equipment for metal corrosion. Through rapid analysis, it can identify the crystal structure and quantitative corrosion and scaling. It also helps engineers understand the cause of the corrosion products formed. Thus, it reduces time cost and allows them to take further action to stop or slow down the corrosion from occurring.
The instrument adopts waterproof and dustproof box all-in-one machine design. It is light and compact, and easy to carry. Therefore, it can be in the location of metal corrosion for a comprehensive in situ inspection, bringing great convenience and efficiency.
XRD is integrated with XRF technology. X-ray photon data of BOTH XRD and XRF can be collected at the same time during each test. This provides material composition, phase and structure information. Consequently, it promotes more accurate test results.
The instrument is operated easily, no need for calibration, automatic detection. Real-time display of full spectrum diffraction, automatic phase analysis, one key to generate quantitative results.
A single analysis only needs about 20 mg of sample to obtain high quality test results. Sample preparation can be completed in 3 minutes (crushing, filtering and sampling) without making, pressing and scraping equal.
The instrument realizes high-speed connection with laptop computer through USB, Bluetooth, WIFI, real-time control and phase analysis of SHINE.
The instrument is equipped with a charge coupled device (CCD) detector. It can take slices of the diffraction ring to help the user know if the sample has been prepared correctly (particle statistics and/or preferred grain orientation). So as to further help users to confirm whether the obtained qualitative and quantitative data is accurate and representative.
| SHINE Family (Portable) | SHINE Metal Corrosion Edition |
| XRD resolution | 0.2°@2θ FWHM |
| 2θ Measuring range | 5-55°2θ |
| Diffraction Geometry | Debye-Scherrer Transmission Geometry |
| The detector | 2000 X 256 pixel, 2d, level 3 Pelter refrigeration CCD |
| X-ray tube target | Cluster microfocal spot X-ray tube, Cu or Co, Cr, Fe, Ni, Mo, Ag, W target (optional according to test sample) |
| X-ray tube voltage | Maximum 50kV, 0-50kV adjustable |
| X-ray tube power | Maximum 40W, 0-40W adjustable |
| XRF energy resolution | 127eV@8keV |
| XRF detection range | Mg—U |
| Sample particle size | Sample particle <150um (100 mesh sieve) |
| Cooling Method | Water Cooling |
| Sample weight | About 20mg |
| Working temperature | -10°C-35°C |
| Weight | 15KG |
| The power supply | Lithium ion battery or power adapter |
| Size | 500mm×400mm×188mm(L×W×H) |
| CrystalX analysis software language | Chinese, English and other languages |