SHINE REX900 X-Ray Diffractometer
SHINE REX900 portable X-ray diffractometer is designed for rapid on-site analysis. It performs X-ray diffraction on the sample and analyses its diffraction pattern to obtain information such as the composition of the material, the structure or morphology of the atoms or molecules inside the material (full crystal phase ID information of the main components, secondary components and trace components of the material).
It has the advantages of simple sample preparation, no pollution, fast measurement, high measurement accuracy, and getting a lot of information about the integrity of the crystal.
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SHINE REX900 X-Ray Diffractometer
SHINE REX900 portable X-ray diffractometer is designed for rapid on-site analysis. It performs X-ray diffraction on the sample and analyses its diffraction pattern to obtain information such as the composition of the material. Moreover, it gives the structure or morphology of the atoms or molecules inside the material. This includes full crystal phase ID information of the main components, secondary components and trace components of the material.
It has the advantages of simple sample preparation, no pollution, fast measurement, and high measurement accuracy. In addition, it provides a lot of information about the integrity of the crystal.
SHINE REX900 has a compact design, easy operation and simple sample preparation. Even non-professional users can use it easily. The instrument is equipped with self-developed intelligent analysis software with a user-friendly interface. Therefore, users can easily analyse and manage data. It is suitable for geological research, field exploration, oil logging and other fields.
It is a reliable analysis tool for geologists and exploration teams. They can quickly obtain material composition and structure information on site.
The instrument adopts a waterproof and dustproof box integrated design, without any mechanical moving parts. It is light and compact, easy to carry, and can be freely used for laboratory/field scientific research.
The equipped DPPS detector offers excellent energy resolution. As a result, the SHINE REX900 can generate diffraction spectra with a high peak-to-background ratio, even under testing conditions using a copper target X-ray tube. This is particularly effective for mineral samples rich in elements such as iron, cobalt, and manganese. For example, it is ideal for samples like iron ore.
Compared with conventional portable XRD, SHINE REX900 has a wider angle range. Thus, it can obtain more comprehensive crystal structure information of materials and provide more accurate qualitative and quantitative analysis. It can also achieve a deeper understanding of the material’s microstructure.
After obtaining the diffraction data, CrystalX automatically performs phase analysis and gives the percentage of phase components. This greatly reduces the requirements for users. There is no need for manual retrieval, background subtraction, smoothing, or manual peak searching. Just click “Start Test”!
The instrument is operated with one button and automatic detection, no calibration required. The full diffraction spectrum is displayed in real time. The instrument automatically performs phase analysis and generates quantitative results with one click.
Files can be in EXCEL, PDF and other formats. Moreover, users can customise test reports, including diffraction spectra and other sample information.
The instrument can achieve high-speed connection with a laptop via USB, Bluetooth, and WIFI. This allows you to control SHINE REX900 and perform phase analysis in real time.
Compared to traditional analytical methods, the SHINE REX900 can often provide results more quickly. Thus, it saves time and resources for law enforcement agencies or third-party laboratories.
| SHINE Family (Portable) | SHINE REX900 |
| XRD resolution | 0.2°@2θ FWHM |
| 2θ Measuring range | 0-90° |
| Diffraction Geometry | Bragg-Brentano Reflection Geometry |
| Detector | DPPS Detector |
| X-ray tube target | Cluster microfocal spot X-ray tube, Cu or Co, Cr, Fe, Ni, Mo, Ag, W target (optional according to test sample) |
| X-ray tube voltage | Maximum 50kV, 0-50kV adjustable |
| X-ray tube power | Maximum 50W, 0-50W adjustable |
| XRF detection range | Mg—U |
| Cooling method | Air Cooling |
| Sample weight | about 1g |
| Working temperature | 0°C-35°C |
| Storage temperature | -10~40℃ |
| Weight | 18kg |
| The power supply | Lithium-ion battery or power adapter |
| Size | 360mm x 265mm x 365mm ( L x W x H ) |
| CrystalX analysis software language | Chinese, English and other languages |
